Microstructural characterization of heteroepitaxial layers of III-V compound semiconductors
<p>This work describes results obtained from TEM, TED and HREM studies of MBE and MOCVD InAS<sub>y</sub>Sb<sub>1</sub><sub>-</sub><sub>y</sub>, MOCVD In<sub>x</sub>Ga<sub>1</sub><sub>-</sub><sub>x</su...
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| Format: | Thesis |
| Language: | English |
| Published: |
1991
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| Subjects: |