Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures

Passivated contact cell architectures have the potential for higher efficiencies than the currently dominant PERC technology. Further development requires greater understanding of the passivation mechanism and potential surface related degradation, especially at polysilicon-oxide-crystalline silicon...

Full description

Bibliographic Details
Main Authors: Shi, Y, Jones, ME, Meier, MS, Wright, M, Polzin, J-A, Kwapil. W, Fischer, C, Schubert, MC, Grovenor, C, Moody, M, Bonilla, RS, Bonilla Osorio, RS
Format: Journal article
Language:English
Published: Elsevier 2022