Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures
Passivated contact cell architectures have the potential for higher efficiencies than the currently dominant PERC technology. Further development requires greater understanding of the passivation mechanism and potential surface related degradation, especially at polysilicon-oxide-crystalline silicon...
| Main Authors: | , , , , , , , , , , , |
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| 格式: | Journal article |
| 语言: | English |
| 出版: |
Elsevier
2022
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