Müller, M., Saxey, D., Cerezo, A., & Smith, G. (2010). Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography. IOP Publishing.
Chicago-referens (17:e uppl.)Müller, M., D. Saxey, A. Cerezo, och G. Smith. Nanoscale Characterization of Compound Semiconductors Using Laser-pulsed Atom Probe Tomography. IOP Publishing, 2010.
MLA-referens (9:e uppl.)Müller, M., et al. Nanoscale Characterization of Compound Semiconductors Using Laser-pulsed Atom Probe Tomography. IOP Publishing, 2010.
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