Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Liknande verk

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  av: Dinelli, F, et al.
  Publicerad: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  av: Kolosov, O, et al.
  Publicerad: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  av: Huey, B, et al.
  Publicerad: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  av: Dinelli, F, et al.
  Publicerad: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  av: Dinelli, F, et al.
  Publicerad: (1999)