Neidio i'r cynnwys
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Iaith
Pob Maes
Teitl
Awdur
Pwnc
Rhif Galw
ISBN/ISSN
Tag
Canfod
Uwch
Measurements of stiff-material...
Dyfynnu hwn
Anfonwch hwn fel neges destun
E-bostio hwn
Argraffu
Allforio Cofnod
Allforio i RefWorks
Allforio i EndNoteWeb
Allforio i EndNote
Permanent link
Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy
Manylion Llyfryddiaeth
Prif Awduron:
Dinelli, F
,
Biswas, S
,
Briggs, G
,
Kolosov, O
Fformat:
Journal article
Cyhoeddwyd:
2000
Daliadau
Disgrifiad
Eitemau Tebyg
Dangos Staff
Eitemau Tebyg
Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
gan: Dinelli, F, et al.
Cyhoeddwyd: (2000)
Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
gan: Kolosov, O, et al.
Cyhoeddwyd: (1996)
Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
gan: Huey, B, et al.
Cyhoeddwyd: (2001)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
gan: Dinelli, F, et al.
Cyhoeddwyd: (1999)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
gan: Dinelli, F, et al.
Cyhoeddwyd: (1999)