Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Lignende værker

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  af: Dinelli, F, et al.
  Udgivet: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  af: Kolosov, O, et al.
  Udgivet: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  af: Huey, B, et al.
  Udgivet: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  af: Dinelli, F, et al.
  Udgivet: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  af: Dinelli, F, et al.
  Udgivet: (1999)