Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Παρόμοια τεκμήρια

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  ανά: Dinelli, F, κ.ά.
  Έκδοση: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  ανά: Kolosov, O, κ.ά.
  Έκδοση: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  ανά: Huey, B, κ.ά.
  Έκδοση: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  ανά: Dinelli, F, κ.ά.
  Έκδοση: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  ανά: Dinelli, F, κ.ά.
  Έκδοση: (1999)