Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Míreanna comhchosúla

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  de réir: Dinelli, F, et al.
  Foilsithe / Cruthaithe: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  de réir: Kolosov, O, et al.
  Foilsithe / Cruthaithe: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  de réir: Huey, B, et al.
  Foilsithe / Cruthaithe: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  de réir: Dinelli, F, et al.
  Foilsithe / Cruthaithe: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  de réir: Dinelli, F, et al.
  Foilsithe / Cruthaithe: (1999)