Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

類似資料

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  著者:: Dinelli, F, 等
  出版事項: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  著者:: Kolosov, O, 等
  出版事項: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  著者:: Huey, B, 等
  出版事項: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  著者:: Dinelli, F, 等
  出版事項: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  著者:: Dinelli, F, 等
  出版事項: (1999)