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Measurements of stiff-material...
Čujuhandieđut
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Doalvun: RefWorks
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Bissovaš liŋka
Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy
Bibliográfalaš dieđut
Váldodahkkit:
Dinelli, F
,
Biswas, S
,
Briggs, G
,
Kolosov, O
Materiálatiipa:
Journal article
Almmustuhtton:
2000
Oažžasuvvandieđut
Govvádus
Geahča maid
Bargiidšearbma
Geahča maid
Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
Dahkki: Dinelli, F, et al.
Almmustuhtton: (2000)
Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
Dahkki: Kolosov, O, et al.
Almmustuhtton: (1996)
Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
Dahkki: Huey, B, et al.
Almmustuhtton: (2001)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
Dahkki: Dinelli, F, et al.
Almmustuhtton: (1999)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
Dahkki: Dinelli, F, et al.
Almmustuhtton: (1999)