Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
语言
全文检索
题名
作者
主题
索引号
ISBN/ISSN
标签
检索
高级检索
Measurements of stiff-material...
引用
发送短信
推荐此
打印
导出纪录
导出到 RefWorks
导出到 EndNoteWeb
导出到 EndNote
Permanent link
Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy
书目详细资料
Main Authors:
Dinelli, F
,
Biswas, S
,
Briggs, G
,
Kolosov, O
格式:
Journal article
出版:
2000
持有资料
实物特征
相似书籍
职员浏览
相似书籍
Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
由: Dinelli, F, et al.
出版: (2000)
Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
由: Kolosov, O, et al.
出版: (1996)
Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
由: Huey, B, et al.
出版: (2001)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
由: Dinelli, F, et al.
出版: (1999)
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
由: Dinelli, F, et al.
出版: (1999)