Measuring Local Mechanical Properties Using FIB Machined Microcantilevers

Micro-scale Focused Ion Beam (FIB) machined cantilevers were manufactured in single crystal copper, polycrystalline copper and a copper-bismuth alloy. These were imaged and tested in bending using a nanoindenter. Cantilevers machined inside a single grain of polycrystalline copper were tested to det...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Armstrong, D, Wilkinson, A, Roberts, S
বিন্যাস: Conference item
প্রকাশিত: 2009

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