Measuring Local Mechanical Properties Using FIB Machined Microcantilevers
Micro-scale Focused Ion Beam (FIB) machined cantilevers were manufactured in single crystal copper, polycrystalline copper and a copper-bismuth alloy. These were imaged and tested in bending using a nanoindenter. Cantilevers machined inside a single grain of polycrystalline copper were tested to det...
| Κύριοι συγγραφείς: | , , |
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| Μορφή: | Conference item |
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2009
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