Wilshaw, P., Blood, A., & Braban, C. (1997). Carrier recombination at defects in silicon: The effect of transition metals and hydrogen passivation.
Chicago-čujuhus (17. p.)Wilshaw, P., A. Blood, juo C. Braban. Carrier Recombination at Defects in Silicon: The Effect of Transition Metals and Hydrogen Passivation. 1997.
MLA-čujuhus (9. p.)Wilshaw, P., et al. Carrier Recombination at Defects in Silicon: The Effect of Transition Metals and Hydrogen Passivation. 1997.
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