Atom probe crystallography: characterization of grain boundary orientation relationships in nanocrystalline aluminium.
Spatial Distribution Maps (SDM) in their various forms have previously been used to identify and characterize crystallographic structure within APT reconstructions. Importantly, it has been shown that such SDM analyses can also provide the crystallographic orientation of the specimen with respect to...
| Päätekijät: | , , , , |
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| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
2011
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