Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions
We have fabricated intrinsic Josephson junction arrays in Tl2Ba2CaCu2O8 thin films using three-dimensional focused-ion-beam milling. We have measured the dependence of the switching current density of these arrays at 4.2 K upon the junction cross-sectional area. There is strong suppression of the sw...
| Main Authors: | , , , |
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| Format: | Conference item |
| Published: |
2006
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