Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system
Systematic measurements of the magnetic moment per Ni atom in Cu/Ni/Cu/Si(001) structures have been made using polarized neutron reflection (PNR) for Ni thicknesses in the range 30Å<t<400å (mcxd),="" (moke),="" (rheed)="" 100="" 30="" <lz=&q...
| Main Authors: | , , , , , , , , , , |
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| Format: | Journal article |
| Published: |
1997
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