Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system

Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system

Systematic measurements of the magnetic moment per Ni atom in Cu/Ni/Cu/Si(001) structures have been made using polarized neutron reflection (PNR) for Ni thicknesses in the range 30Å<t<400å (mcxd),="" (moke),="" (rheed)="" 100="" 30="" <lz=&q...

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التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Hope, S, Lee, J, Rosenbusch, P, Lauhoff, G, Bland, J, Ercole, A, Bucknall, D, Penfold, J, Lauter, H, Lauter, V, Cubitt, R
التنسيق: Journal article
منشور في: 1997

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