Adaptive optics enables 3D STED microscopy in aberrating specimens.

Stimulated emission depletion (STED) microscopy allows fluorescence far-field imaging with diffraction-unlimited resolution. Unfortunately, extending this technique to three-dimensional (3D) imaging of thick specimens has been inhibited by sample-induced aberrations. Here we present the first implem...

詳細記述

書誌詳細
主要な著者: Gould, T, Burke, D, Bewersdorf, J, Booth, M
フォーマット: Journal article
言語:English
出版事項: 2012

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