Grain boundary misorientation and thermal grooving in cube-textured Ni and Ni-Cr tape
AFM and EBSD characterization has been carried out to measure the degree of grain boundary grooving in cube-textured Ni and Ni-10wt%Cr substrates. Low angle grain boundary grooves are found to be consistently shallower than grooves at high angle boundaries. Our results suggest that the recrystalliza...
Main Authors: | Gladstone, T, Moore, J, Wilkinson, A, Grovenor, C |
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格式: | Conference item |
出版: |
2001
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