Grain boundary misorientation and thermal grooving in cube-textured Ni and Ni-Cr tape

AFM and EBSD characterization has been carried out to measure the degree of grain boundary grooving in cube-textured Ni and Ni-10wt%Cr substrates. Low angle grain boundary grooves are found to be consistently shallower than grooves at high angle boundaries. Our results suggest that the recrystalliza...

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Príomhchruthaitheoirí: Gladstone, T, Moore, J, Wilkinson, A, Grovenor, C
Formáid: Conference item
Foilsithe / Cruthaithe: 2001