Force-induced rupture of a DNA duplex: from fundamentals to force sensors

The rupture of double-stranded DNA under stress is a key process in biophysics and nanotechnology. In this article, we consider the shear-induced rupture of short DNA duplexes, a system that has been given new importance by recently designed force sensors and nanotechnological devices. We argue that...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Mosayebi, M, Louis, AA, Doye, JPK, Ouldridge, TE
Aineistotyyppi: Journal article
Kieli:English
Julkaistu: American Chemical Society 2015