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Residual stress measurement in...
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Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
Show other versions (1)
Bibliographic Details
Main Authors:
Song, X
,
Yeap, K
,
Zhu, J
,
Belnoue, J
,
Sebastiani, M
,
Bemporad, E
,
Zeng, K
,
Korsunsky, A
Format:
Journal article
Published:
2012
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Description
Other Versions (1)
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