APA引文

Song, X., Yeap, K., Zhu, J., Belnoue, J., Sebastiani, M., Bemporad, E., . . . Korsunsky, A. (2012). Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging.

Chicago Style (17th ed.) Citation

Song, X., K. Yeap, J. Zhu, J. Belnoue, M. Sebastiani, E. Bemporad, K. Zeng, and A. Korsunsky. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.

MLA引文

Song, X., et al. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.