APA (7th ed.) Citation

Song, X., Yeap, K., Zhu, J., Belnoue, J., Sebastiani, M., Bemporad, E., . . . Korsunsky, A. (2012). Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging.

Chicago Style (17th ed.) Citation

Song, X., K. Yeap, J. Zhu, J. Belnoue, M. Sebastiani, E. Bemporad, K. Zeng, and A. Korsunsky. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.

MLA (9th ed.) Citation

Song, X., et al. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.