Cita APA

Song, X., Yeap, K., Zhu, J., Belnoue, J., Sebastiani, M., Bemporad, E., . . . Korsunsky, A. (2012). Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging.

Citación estilo Chicago

Song, X., K. Yeap, J. Zhu, J. Belnoue, M. Sebastiani, E. Bemporad, K. Zeng, and A. Korsunsky. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.

Cita MLA

Song, X., et al. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.