APA-referens (7:e uppl.)

Song, X., Yeap, K., Zhu, J., Belnoue, J., Sebastiani, M., Bemporad, E., . . . Korsunsky, A. (2012). Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging.

Chicago-referens (17:e uppl.)

Song, X., K. Yeap, J. Zhu, J. Belnoue, M. Sebastiani, E. Bemporad, K. Zeng, och A. Korsunsky. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.

MLA-referens (9:e uppl.)

Song, X., et al. Residual Stress Measurement in Thin Films at Sub-micron Scale Using Focused Ion Beam Milling and Imaging. 2012.