Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Míreanna comhchosúla

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  de réir: Song, X, et al.
  Foilsithe / Cruthaithe: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  de réir: Song, X, et al.
  Foilsithe / Cruthaithe: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  de réir: Sebastiani, M, et al.
  Foilsithe / Cruthaithe: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  de réir: Sebastiani, M, et al.
  Foilsithe / Cruthaithe: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  de réir: Korsunsky, A, et al.
  Foilsithe / Cruthaithe: (2009)