Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

समान संसाधन

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  द्वारा: Song, X, और अन्य
  प्रकाशित: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  द्वारा: Song, X, और अन्य
  प्रकाशित: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  द्वारा: Sebastiani, M, और अन्य
  प्रकाशित: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  द्वारा: Sebastiani, M, और अन्य
  प्रकाशित: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  द्वारा: Korsunsky, A, और अन्य
  प्रकाशित: (2009)