Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Παρόμοια τεκμήρια

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  ανά: Song, X, κ.ά.
  Έκδοση: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  ανά: Song, X, κ.ά.
  Έκδοση: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  ανά: Sebastiani, M, κ.ά.
  Έκδοση: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  ανά: Sebastiani, M, κ.ά.
  Έκδοση: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  ανά: Korsunsky, A, κ.ά.
  Έκδοση: (2009)