Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Ижил төстэй зүйлс

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  -н: Song, X, зэрэг
  Хэвлэсэн: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  -н: Song, X, зэрэг
  Хэвлэсэн: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  -н: Sebastiani, M, зэрэг
  Хэвлэсэн: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  -н: Sebastiani, M, зэрэг
  Хэвлэсэн: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  -н: Korsunsky, A, зэрэг
  Хэвлэсэн: (2009)