Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

Samankaltaisia teoksia

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  Tekijä: Song, X, et al.
  Julkaistu: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  Tekijä: Song, X, et al.
  Julkaistu: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  Tekijä: Sebastiani, M, et al.
  Julkaistu: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  Tekijä: Sebastiani, M, et al.
  Julkaistu: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  Tekijä: Korsunsky, A, et al.
  Julkaistu: (2009)