Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

類似資料

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  著者:: Song, X, 等
  出版事項: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  著者:: Song, X, 等
  出版事項: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  著者:: Sebastiani, M, 等
  出版事項: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  著者:: Sebastiani, M, 等
  出版事項: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  著者:: Korsunsky, A, 等
  出版事項: (2009)