Microstructure and x-ray microtomographic characterisation of deformation in electrodeposited nickel thin-walled hollow spheres
Nanocrystalline grain sizes in the walls of electrodeposited nickel thin-walled hollow spheres were quantified in FIB-TEM and found to fit a log-normal distribution. Based on the microstructure and nanoindentation properties, reliable material data were determined and related to predict bulk compres...
| Asıl Yazarlar: | , , |
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| Materyal Türü: | Journal article |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
2013
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