Determining the composition of small features in atom probe: bcc Cu-rich precipitates in an Fe-rich matrix

Aberrations in the ion trajectories near the specimen surface are an important factor in the spatial resolution of the atom probe technique. Near the boundary between two phases with dissimilar evaporation fields, ion trajectory overlaps may occur, leading to a biased measurement of composition in t...

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Bibliographic Details
Main Authors: Morley, A, Sha, G, Hirosawa, S, Cerezo, A, Smith, G
Format: Journal article
Language:English
Published: Elsevier 2009
Subjects: