Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold

Bibliographic Details
Main Authors:	Cavalleri, A, Siders, C, Rose-Petruck, C, Jimenez, R, Toth, C, Squier, J, Barty, C, Wilson, K, Sokolowski-Tinten, K, von Hoegen, M, von der Linde, D
Format:	Journal article
Published:	2001

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