Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold

Detalhes bibliográficos
Main Authors:	Cavalleri, A, Siders, C, Rose-Petruck, C, Jimenez, R, Toth, C, Squier, J, Barty, C, Wilson, K, Sokolowski-Tinten, K, von Hoegen, M, von der Linde, D
Formato:	Journal article
Publicado em:	2001

Registos relacionados