Cavalleri, A., Siders, C., Rose-Petruck, C., Jimenez, R., Toth, C., Squier, J., . . . von der Linde, D. (2001). Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold.
Chicago Style (17th ed.) CitationCavalleri, A., et al. Ultrafast X-ray Measurement of Laser Heating in Semiconductors: Parameters Determining the Melting Threshold. 2001.
MLA (9th ed.) CitationCavalleri, A., et al. Ultrafast X-ray Measurement of Laser Heating in Semiconductors: Parameters Determining the Melting Threshold. 2001.
Warning: These citations may not always be 100% accurate.