Cavalleri, A., Siders, C., Rose-Petruck, C., Jimenez, R., Toth, C., Squier, J., . . . von der Linde, D. (2001). Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold.
Style de citation Chicago (17e éd.)Cavalleri, A., et al. Ultrafast X-ray Measurement of Laser Heating in Semiconductors: Parameters Determining the Melting Threshold. 2001.
Style de citation MLA (9e éd.)Cavalleri, A., et al. Ultrafast X-ray Measurement of Laser Heating in Semiconductors: Parameters Determining the Melting Threshold. 2001.
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