High-resolution TEM and the application of direct and indirect aberration correction.
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Correction of the aberrations has been achieved electron-optically through a hexapole-based corrector and also indirectly by computational analysis of a focal or ti...
| Main Authors: | , , , , , , |
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| Format: | Conference item |
| Published: |
2008
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