Cryogenic rds(on) of a GaN power transistor at high currents

Cryogenic rds(on) of a GaN power transistor at high currents

The dramatic reduction in the on-state resistance of Gallium Nitride (GaN) HEMTs at cryogenic temperatures can be exploited to reduce conduction losses in power converters. In this paper, we present a low-cost and easily implementable methodology for the characterisation of the on-state resistance o...

書誌詳細
主要な著者:	Bruford, J, Rogers, DJ, Rodriguez, T
フォーマット:	Conference item
言語:	English
出版事項:	IEEE 2023

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