Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS
Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampl...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
International Union of Crystallography (IUCr)
2002
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| Subjects: |