Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

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Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampl...

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Bibliographic Details
Main Authors: Korsunsky, A, Collins, S, Owen, R, Daymond, M, Achtioui, S, James, K
Format: Journal article
Language:English
Published: International Union of Crystallography (IUCr) 2002
Subjects:
Engineering & allied sciences
Description
Summary:Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10⁻⁴. This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.

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