Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS
Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampl...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
International Union of Crystallography (IUCr)
2002
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| _version_ | 1797080674234007552 |
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| author | Korsunsky, A Collins, S Owen, R Daymond, M Achtioui, S James, K |
| author_facet | Korsunsky, A Collins, S Owen, R Daymond, M Achtioui, S James, K |
| author_sort | Korsunsky, A |
| collection | OXFORD |
| description | Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10⁻⁴. This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source. |
| first_indexed | 2024-03-07T01:03:29Z |
| format | Journal article |
| id | oxford-uuid:8a82ddb6-253a-4506-b7b5-959f329b43ac |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T01:03:29Z |
| publishDate | 2002 |
| publisher | International Union of Crystallography (IUCr) |
| record_format | dspace |
| spelling | oxford-uuid:8a82ddb6-253a-4506-b7b5-959f329b43ac2022-03-26T22:32:02ZFast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRSJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:8a82ddb6-253a-4506-b7b5-959f329b43acEngineering & allied sciencesEnglishOxford University Research Archive - ValetInternational Union of Crystallography (IUCr)2002Korsunsky, ACollins, SOwen, RDaymond, MAchtioui, SJames, KSynchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10⁻⁴. This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source. |
| spellingShingle | Engineering & allied sciences Korsunsky, A Collins, S Owen, R Daymond, M Achtioui, S James, K Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title | Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title_full | Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title_fullStr | Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title_full_unstemmed | Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title_short | Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS |
| title_sort | fast residual stress mapping using energy dispersive synchrotron x ray diffraction on station 16 3 at the srs |
| topic | Engineering & allied sciences |
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