Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS
Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampl...
| Auteurs principaux: | , , , , , |
|---|---|
| Format: | Journal article |
| Langue: | English |
| Publié: |
International Union of Crystallography (IUCr)
2002
|
| Sujets: |