$Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS$

Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

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Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampl...

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Bibliografische gegevens
Hoofdauteurs:	Korsunsky, A, Collins, S, Owen, R, Daymond, M, Achtioui, S, James, K
Formaat:	Journal article
Taal:	English
Gepubliceerd in:	International Union of Crystallography (IUCr) 2002
Onderwerpen:	Engineering & allied sciences

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