Mapping strains at the nanoscale using electron back scatter diffraction
In this paper, we describe the use of electron back scatter diffraction (EBSD) to study strain variations in crystalline samples at the nanoscale. The analysis relies on cross correlation measurements of small shifts in the EBSD pattern measured at many points dispersed across the pattern. The metho...
| Main Authors: | , , |
|---|---|
| Format: | Journal article |
| Language: | English |
| Published: |
2009
|