COMMENTS ON GRAIN-BOUNDARY CONTRAST IN FIELD-ION MICROSCOPE IMAGES .1.

COMMENTS ON GRAIN-BOUNDARY CONTRAST IN FIELD-ION MICROSCOPE IMAGES .1.

ग्रंथसूची विवरण
मुख्य लेखकों:	Smith, D, Smith, G
स्वरूप:	Journal article
प्रकाशित:	1973

समान संसाधन

Some aspects of image projection in the field-ion microscope
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1999)

ANALOG INVESTIGATIONS OF ELECTRIC-FIELD DISTRIBUTION AND ION TRAJECTORIES IN FIELD-ION MICROSCOPE
द्वारा: Birdseye, P, और अन्य
प्रकाशित: (1974)

FRACTURE OF FIELD-ION MICROSCOPE SPECIMENS
द्वारा: Wilkes, T, और अन्य
प्रकाशित: (1972)

Simulation of channeling contrast in scanning ion microscope images
द्वारा: Kaoru Ohya
प्रकाशित: (2018-01-01)

FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES
द्वारा: Bhatti, A, और अन्य
प्रकाशित: (1985)

SOME ASPECTS OF THE MEASUREMENT OF PRECIPITATE SIZE IN THE FIELD-ION MICROSCOPE
द्वारा: Sha, W, और अन्य
प्रकाशित: (1991)

ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
द्वारा: King, R, और अन्य
प्रकाशित: (1995)

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF GRIDDED SILICON FIELD EMITTERS
द्वारा: Huang, M, और अन्य
प्रकाशित: (1994)

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
द्वारा: King, R, और अन्य
प्रकाशित: (1995)

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS
द्वारा: King, R, और अन्य
प्रकाशित: (1994)

PHASE-CONTRAST IMAGING OF TISSUE IN THE SCANNING ACOUSTIC MICROSCOPE
द्वारा: Daft, C, और अन्य
प्रकाशित: (1985)

Response to Comments on Paper on Grain Boundary Scattering Model for Metals
द्वारा: F. Warkusz
प्रकाशित: (1981-01-01)

SEGREGATION TO GRAIN BOUNDARIES IN Si.
द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1984)

AS SEGREGATION TO GRAIN-BOUNDARIES IN SI
द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1984)

Characterization and modeling of nanotips fabricated in the field ion microscope
द्वारा: Ali Ahmed, और अन्य
प्रकाशित: (2016-06-01)

Three-Dimensional Imaging of Metallic Grain by Stacking the Microscopic Images
द्वारा: Jinyi Lee, और अन्य
प्रकाशित: (2021-08-01)

Detection and Recognition of Pollen Grains in Multilabel Microscopic Images
द्वारा: Elżbieta Kubera, और अन्य
प्रकाशित: (2022-03-01)

GRAIN-SIZE STRENGTHENING IN STEEL AND ITS RELATIONSHIP TO GRAIN-BOUNDARY SEGREGATION OF CARBON
द्वारा: Mintz, B, और अन्य
प्रकाशित: (1992)

Microscopic-plastic deformation behavior of grain boundary precipitates in an Al–Zn–Mg alloy
द्वारा: Sangyul Ha, और अन्य
प्रकाशित: (2024-05-01)

Differentiating grain and grain boundary ionic conductivities of Li-ion antiperovskite electrolytes
द्वारा: Jingfeng Zheng, और अन्य
प्रकाशित: (2022-11-01)

NUCLEATION AND MIGRATION OF HIGH ANGLE GRAIN-BOUNDARIES IN BILAYER FOILS .1. NUCLEATION
द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1980)

Applications of scanning ion conductance microscope in biomedical fields
द्वारा: Xinrui Gong, और अन्य
प्रकाशित: (2023-03-01)

CHEMICAL EFFECTS ON GRAIN BOUNDARY MIGRATION IN Si AND Ge.
द्वारा: Smith, D, और अन्य
प्रकाशित: (1986)

FIM-TEM OBSERVATIONS OF GRAIN-BOUNDARY STRUCTURE
द्वारा: Beaven, P, और अन्य
प्रकाशित: (1980)

Development of high throughput microscope mode secondary ion mass spectrometry imaging
द्वारा: Green, FM, और अन्य
प्रकाशित: (2023)

Ion microscope imaging mass spectrometry using a Timepix3-based optical camera
द्वारा: Wood, D, और अन्य
प्रकाशित: (2022)

Microscopic model of electric-field-noise heating in ion traps
द्वारा: Safavi-Naini, Arghavan, और अन्य
प्रकाशित: (2011)

Contrasting the grain boundary-affected performance of zinc and indium oxide transparent conductors
द्वारा: Vai, A, और अन्य
प्रकाशित: (2016)

Li-ion conductivity in Li2OHCl1-xBrx solid electrolytes: grains, grain boundaries and interfaces
द्वारा: Lee, HJ, और अन्य
प्रकाशित: (2022)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
द्वारा: Pennycook, S, और अन्य
प्रकाशित: (2000)

GRAIN-BOUNDARY SOLUTE INTERACTIONS IN POLYCRYSTALLINE SILICON AND GERMANIUM
द्वारा: Smith, D, और अन्य
प्रकाशित: (1984)

Interaction of the solute niobium or molybdenum with grain boundaries in alpha-iron
द्वारा: Maruyama, N, और अन्य
प्रकाशित: (2003)

STRUCTURAL AND ELECTRICAL EFFECTS OF DOPANT SEGREGATION TO SILICON GRAIN-BOUNDARIES
द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1985)

MALDI and SIMS microscope mode imaging mass spectrometry
द्वारा: Smith, N
प्रकाशित: (2023)

Fine-Grained Boundary Conditions in Field-Based Routing
द्वारा: Jihoon Sung, और अन्य
प्रकाशित: (2024-01-01)

Automated morphometry toolbox for analysis of microscopic model organisms using simple bright-field imaging
द्वारा: Guanghui Liu, और अन्य
प्रकाशित: (2019-03-01)

Grain Boundary Chemistry Before and After Ion Implantation in ODS Steels
द्वारा: Marquis, E, और अन्य
प्रकाशित: (2009)

Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
द्वारा: Chen Lianwei, और अन्य
प्रकाशित: (2018-01-01)

A miniature multi-contrast microscope for functional imaging in freely behaving animals
द्वारा: Janaka Senarathna, और अन्य
प्रकाशित: (2019-01-01)

A dataset for automatic contrast enhancement of microscopic malaria infected blood RGB images
द्वारा: J. Somasekar, और अन्य
प्रकाशित: (2019-12-01)