A new approach for 3D quantitative STEM using defocus corrected electron ptychography

A new approach for 3D quantitative STEM using defocus corrected electron ptychography

Bibliographic Details
Main Authors: Mostaed, A, Liberti, E, Huang, C, Kirkland, AI, Nellist, P
Format: Journal article
Language:English
Published: Oxford University Press 2022

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