Depth sectioning using electron energy loss spectroscopy

Depth sectioning using electron energy loss spectroscopy

The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of fo...

Podrobná bibliografie
Hlavní autoři:	D'Alfonso, A, Cosgriff, E, Findlay, S, Kirkland, A, Nellist, P, Oxley, M, Allen, L
Médium:	Conference item
Vydáno:	2008

Podobné jednotky

Theoretical interpretation of electron energy-loss spectroscopic images
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Vydáno: (2008)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
Autor: Nellist, P, a další
Vydáno: (2008)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
Autor: Cosgriff, E, a další
Vydáno: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
Autor: Cosgriff, E, a další
Vydáno: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopt, Part I: elastic scattering
Autor: Cosgriff, E, a další
Vydáno: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
Autor: Nellist, P, a další
Vydáno: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
Autor: D'Alfonso, A, a další
Vydáno: (2008)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
Autor: Cosgriff, E, a další
Vydáno: (2010)

Simulating atomic resolution STEM images of non-periodic samples
Autor: Findlay, S, a další
Vydáno: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
Autor: Behan, G, a další
Vydáno: (2009)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
Autor: Nellist, P, a další
Vydáno: (2008)

Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
Autor: Nellist, P, a další
Vydáno: (2008)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
Autor: Wang, P, a další
Vydáno: (2011)

A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
Autor: Cosgriff, E, a další
Vydáno: (2007)

Probing the bonding in nitrogen-doped graphene using electron energy loss spectroscopy.
Autor: Nicholls, R, a další
Vydáno: (2013)

Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
Autor: Nellist, P, a další
Vydáno: (2007)

Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy
Autor: Klie, R, a další
Vydáno: (2003)

Nanohalos: a manifestation of electron channelling in gold nanoparticles.
Autor: Ruben, G, a další
Vydáno: (2012)

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
Autor: Behan, G, a další
Vydáno: (2008)

Forecasting of in situ electron energy loss spectroscopy
Autor: Nicholas R. Lewis, a další
Vydáno: (2022-12-01)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Autor: Wang, P, a další
Vydáno: (2009)

Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy
Autor: Klie, Robert F., a další
Vydáno: (2011)

Electron energy loss spectroscopy of fullerene materials
Autor: Nicholls, R
Vydáno: (2006)

Electron energy-loss spectroscopy of autoionizing states of zinc
Autor: Predojević B., a další
Vydáno: (2004-01-01)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
Autor: Wang, P, a další
Vydáno: (2010)

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
Autor: Nicolosi, V, a další
Vydáno: (2010)

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
Autor: Nicolosi, V, a další
Vydáno: (2010)

Deterministic electron ptychography at atomic resolution
Autor: D'Alfonso, A, a další
Vydáno: (2014)

Applications of the Oxford-JEOL aberration-corrected electron microscope
Autor: Nellist, P, a další
Vydáno: (2010)

Electron energy loss spectroscopy for differentiating of minerals polymorphs
Autor: Roddatis Vladimir, a další
Vydáno: (2024-01-01)

Electron energy-loss spectroscopy of branched gap plasmon resonators
Autor: Søren Raza, a další
Vydáno: (2016-12-01)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Autor: Kirkland, A, a další
Vydáno: (2008)

Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra.
Autor: Arslan, I, a další
Vydáno: (2003)

Photoemission and electron-energy-loss-spectroscopy study of BaRuO3.
Autor: Gulino, A, a další
Vydáno: (1995)

Automatic signal clasification of the Low-Loss Region in Electron Energy Loss Spectroscopy
Autor: Costa-Ledesma Vanessa, a další
Vydáno: (2024-01-01)

Determination of the energy loss function of tungsten from reflection electron energy loss spectroscopy spectra
Autor: Z. Li, a další
Vydáno: (2024-01-01)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Autor: Kirkland, A, a další
Vydáno: (2008)

Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride.
Autor: Lozano, J, a další
Vydáno: (2014)

Quantitative techniques for aberration corrected HAADF STEM of nano-materials
Autor: E, H, a další
Vydáno: (2012)

Graphene nanowalls formation investigated by Electron Energy Loss Spectroscopy
Autor: Badri Vishal, a další
Vydáno: (2024-01-01)